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CHOTEST SJ5701

Contour and Surface Roughness Measuring Machine CHOTEST SJ5701

Universal measuring device for precise contour and surface roughness measurement. The system offers motorized X and Z axis movement with the possibility of fully automatic measurement cycles; the detector unit is manually adjustable. The SJ5701 combines high precision, stability, and user-friendly operation.

Suitable for metrology laboratories or dedicated areas in production environments where reliable surface quality and contour inspection is required. Scope of delivery includes adjustable XY stage, calibration standards for user calibration of contour and roughness, control PC, 22” display, and the comprehensive CHOTEST software package.

Detailed Technical Data:

Contour measurement:
1. X-axis measuring range: 0–200 mm
2. X-axis resolution: 0.01 µm
3. X-axis straightness: 0.4 µm/100 mm
4. X-axis indication error: ±(0.6+1.5L/100) µm
5. Z1-axis measuring range: ±25 mm
6. Z1-axis resolution: 0.01 µm
7. Z1-axis indication error: ±(0.6+|4H|/100) µm
8. Z-axis measuring range: 0–450 mm
9. Weight: 150 kg
10. Dimensions: 800×450×1000 mm

Roughness measurement:
1. X-axis measuring range: 0–200 mm
2. Z1-axis measuring range: ±400 µm
3. Z1-axis resolution: 0.001 µm
4. Straightness error: ≤0.15 µm/20 mm, ≤0.4 µm/100 mm
5. Indication error: ±(0.005+0.025A) µm, A(Ra) µm
6. Measurement residual: ≤0.005 µm

Accessories:
1. Jaw vice
2. Workpiece table
3. Dell Optiplex 3000MT PC
4. Dell 24” display
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Terms and conditions:
Delivery terms: FCA Wrocław, Poland or FCA České Budějovice, Czech Republic
Payment terms: 100% advance payment required prior to delivery
Delivery time: Available 1–2 weeks after purchase agreement signing
Warranty: This is a used laboratory testing device. Customers may inspect the machine prior to delivery, including a functional test. The machine is sold “as is, where is.”

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